Awards Gallery
Year 2000
- ISTFA, the International Symposium for Testing & Failure Analysis 2000 for "Best Paper Award" & 2001 for "Best in Session" Paper Award
- PELS Prize Outstanding Paper Award (2000), IEEE Transactions on Power Electronics, USA
Dr. Phang Chee Hong, Jacob
Dr. Chan Siu Hung, Daniel
ISTFA, the International Symposium for Testing & Failure Analysis 2000 for "Best Paper Award" & 2001 for "Best in Session" Paper AwardThe ISTFA 2000 Best Paper Award was presented
at the International Symposium on Testing
and Failure Analysis (ISTFA 2001 held
in Santa Clara, California, USA) to the
co-authors JM Chin, M Palaniappan, JCH
Phang, DSH Chan, CE Soh and G Gilfeather
of the paper entitled "Appplication of
Single Contact Optical Beam Induce Currents
(SCOBIC) for Backside Failure Analysis".
The results were obtained by researchers
from NUS ECE Department's Centre for Integrated
Circuit Failure Analysis and Reliability
working in collaboration with Advanced
Micro Devices (AMD).
Application of a single contact optical beam induced currents on backside failure analysis
Abstract >> The single contact optical beam induced
currents (SCOBIC) method is a new failure
analysis technique. By connecting the
substrate or power pins of an integrated
circuit to the current amplifier, many
junctions can be imaged. This is in contrast
to the optical beam induced current (OBIC)
technique, where only the junction directly
connected to the current amplifier is
imaged. The implementation of the SCOBIC
approach is discussed and experimental
results which validate the SCOBIC technique
are presented. Application of the SCOBIC
technique for CMOS front side and back
side devices is also discussed.
Physical and Failure Analysis of Integrated
Circuits, 2001.
Proceedings of the 2001 8th International
Symposium
Publication Date: 2001
On page(s): 42-49
------------------------------------------------------
For further information, please contact:
Dr. Phang Chee Hong, Jacob
Email: elejpch@nus.edu.sg
Telephone: 6516 2132
Dr. Chan Siu Hung, Daniel
Dr. Phang Chee Hong, Jacob
ISTFA, the International
Symposium for Testing & Failure Analysis
2000 for "Best Paper Award"& 2001 for "Best in Session" Paper Award
The ISTFA 2000 Best Paper Award was presented
at the International Symposium on Testing
and Failure Analysis (ISTFA 2001 held
in Santa Clara, California, USA) to the
co-authors JM Chin, M Palaniappan, JCH
Phang, DSH Chan, CE Soh and G Gilfeather
of the paper entitled "Appplication of
Single Contact Optical Beam Induce Currents
(SCOBIC) for Backside Failure Analysis".
The results were obtained by researchers
from NUS ECE Department's Centre for Integrated
Circuit Failure Analysis and Reliability
working in collaboration with Advanced
Micro Devices (AMD).
Application of a single contact optical beam induced currents on backside failure analysis
Abstract >> The single contact optical beam induced
currents (SCOBIC) method is a new failure
analysis technique. By connecting the
substrate or power pins of an integrated
circuit to the current amplifier, many
junctions can be imaged. This is in contrast
to the optical beam induced current (OBIC)
technique, where only the junction directly
connected to the current amplifier is
imaged. The implementation of the SCOBIC
approach is discussed and experimental
results which validate the SCOBIC technique
are presented. Application of the SCOBIC
technique for CMOS front side and back
side devices is also discussed.
Physical and Failure Analysis of Integrated
Circuits, 2001.
Proceedings of the 2001 8th International
Symposium
Publication Date: 2001
On page(s): 42-49
------------------------------------------------------
For further information, please contact:
Dr. Chan
Siu Hung, Daniel
Email: elecshd@nus.edu.sg
Telephone: 6516 2117
Dr. Ramesh Oruganti
Dr. Liang Yung Chii
Mr Pan Honglin
PELS Prize Outstanding
Paper Award (2000), IEEE Transactions on Power Electronics,
USAStaff members from the Department of Electrical
and Computer Engineering, Associate Professor
Yung C. Liang and Associate Professor
Ramesh Oruganti, and graduate student
Mr Pan Honglin have won the IEEE Power
Electronics Transactions Paper Prize for
their outstanding paper. The paper was
published in the IEEE Transactions on
Power Electronics in 1999, and was one
of three best papers published in that
year.
The award papers are selected based on
originality, contributions to the field,
extent to which the paper is supported
by analysis and experimental evidence,
and the quality of presentation.
Design of Smart Power Synchronous Rectifier
Abstract >> In low-output-voltage DC/DC power converters,
power losses due to the conduction of
rectifying devices are significant. Using
synchronous rectifiers instead of the
conventional fast recovery diodes or Schottky
diodes is an effective solution to this
problem in most topologies. However, for
synchronous rectifiers to perform effectively,
this requires an external gate drive with
proper sensing and timing control circuits.
This can increase the complexity and cost
in power converter hardware implementation.
For the first time, a smart power synchronous
rectifier (SPSR), which is a two-terminal
MOS rectifier, is designed to overcome
this difficulty. The SPSR integrates a
simple control unit with a power MOSFET
into a smart module to form a self-controlled
synchronous rectifier. It has great advantages
over the conventional discrete circuit
composition, such as integrated gate control,
precise timing switching and fast transient
response, which are suitable for applications
in high-frequency pulsewidth modulation
(PWM) power converter circuits
IEEE Transactions on Power Electronics
Publication Date: March 1999
Volume: 14, Issue 2 on page(s): 308-315
------------------------------------------------------
For further information, please contact:
Dr. Ramesh Oruganti
Email: eleramsh@nus.edu.sg
Telephone: 6516 2133<
Dr. Liang Yung Chii
Dr. Ramesh Oruganti
Mr Pan Honglin
PELS Prize Outstanding
Paper Award (2000), IEEE Transactions on Power Electronics,
USAStaff members from the Department of Electrical
and Computer Engineering, Associate Professor
Yung C. Liang and Associate Professor
Ramesh Oruganti, and graduate student
Mr Pan Honglin have won the IEEE Power
Electronics Transactions Paper Prize for
their outstanding paper. The paper was
published in the IEEE Transactions on
Power Electronics in 1999, and was one
of three best papers published in that
year.
The award papers are selected based on
originality, contributions to the field,
extent to which the paper is supported
by analysis and experimental evidence,
and the quality of presentation.
Design of Smart Power Synchronous Rectifier
Abstract >> In low-output-voltage DC/DC power converters,
power losses due to the conduction of
rectifying devices are significant. Using
synchronous rectifiers instead of the
conventional fast recovery diodes or Schottky
diodes is an effective solution to this
problem in most topologies. However, for
synchronous rectifiers to perform effectively,
this requires an external gate drive with
proper sensing and timing control circuits.
This can increase the complexity and cost
in power converter hardware implementation.
For the first time, a smart power synchronous
rectifier (SPSR), which is a two-terminal
MOS rectifier, is designed to overcome
this difficulty. The SPSR integrates a
simple control unit with a power MOSFET
into a smart module to form a self-controlled
synchronous rectifier. It has great advantages
over the conventional discrete circuit
composition, such as integrated gate control,
precise timing switching and fast transient
response, which are suitable for applications
in high-frequency pulsewidth modulation
(PWM) power converter circuits
IEEE Transactions on Power Electronics
Publication Date: March 1999
Volume: 14, Issue 2 on page(s): 308-315
------------------------------------------------------
For further information, please contact:
Dr. Liang Yung Chii
Email: elelyc@nus.edu.sg
Telephone: 6516 2175
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