Dr. Xudong CHEN received the B.E. and M.E. degrees in electrical engineering from Zhejiang University, China, in 1999 and 2001, respectively, and the Ph.D. degree in EECS from the Massachusetts Institute of Technology, USA, in 2005. Since then he joined the Department of Electrical and Computer Engineering, National University of Singapore, Singapore, and he is currently an Associate Professor. His research interests are mainly electromagnetic inverse problems. He has published about 130 peer-reviewed journal papers on inverse scattering problems, material parameter retrieval, optical microscopy, and optical encryption. He visited the University of Paris-SUD 11 in May-June 2010 as an invited visiting Associate Professor. He took sabbatical leave at the Stanford University in 2012-2013, where he worked on microwave impedance tomography. He was the recipient of the Young Scientist Award by the Union Radio-Scientifique Internationale (URSI) in 2010 and the “Engineering Young Researcher Award” in the Faculty of Engineering, National University of Singapore in 2015. He is currently an Associate Editor of the IEEE Transactions on Microwave Theories and Technique.