This reliability test system can be used for reliability testing and
failure analysis of devices such as GMR and TMR read sensors such as
electromigration and dielectric breakdown measurements. It is able to plot
curves of current-voltage (I-V), voltage-current (V-I) and
current-resistance (I-R) characteristics automatically under various testing
conditions. This reliability test system is able to consistently allow the
measurement of device data at both ambient and 300oC and at micro-Ampere
ranges.
Useful link: www.keithly.com
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