Curriculum Vitae

Name: Jacob CH PHANG
Present Appointment: Professor
Contact Information:
Electrical and Computer Engineering Department
National University of Singapore
4 Engineering Drive 3
Singapore 117586
Tel: +65-6516-2132; fax +65-6779-1103; email: jacob.phang@nus.edu.sg
Research Areas:
  • Integrated circuit failure analysis: fault localization and defect characterization
  • Solar cell characterization
  • Scanning optical beam, electron beam and probe microscopy
Teaching Areas:
  • Microelectronics
Academic/Professional Qualifications:
  • BA (1975), University of Cambridge
  • PhD (1979), University of Cambridge
Awards/Honours (Post-PhD):
  • National Young Scientist and Engineer Award (1988)
  • ASEAN Achievement Award for Research and Development (1995)
  • Public Administation Medal (Silver) (1996)
  • Appointment to rank of “Chevalier” in the order of “Palmes Academiques”, Republic of France (2002)
  • President’s Technology Award, Republic of Singapore (2009)
Career History:
  • Lecturer (1979-1984)
  • Senior Lecturer (1984-1992)
  • Associate Professor (1992-1998)
  • Professor (1998-now)
Administrative Leadership:
  • Director, International Relations Office (1996-1998)
  • Director, Office of University Relations (1998-2000)
  • Director, International Relations Office (2000-2001)
  • Senior Director, NUS Enterprise (International) (2001-2002)
  • CEO, NUS Enterprise (2002-2006)
Professional/Consulting Activities:
  • Chairman, SEMICAPS Corporation Pte Ltd (1993-now)
  • Special Advisor, (Technopreneurship 21), National Science & Technology Board, (1999-2000)
  • Board Member, Defence Science and Technology Agency, Singapore (2004-2010)
  • Director, Cap Vista Pte Ltd, (2005-2010)
Major Publications (Maximum of 3):
  • Phang JCH, Goh SH, Quah ACT, Chua CM, Koh LS, Tan SH, Chua WP, "Resolution and Sensitivity Enhancements of Scanning Optical Microscopy Techniques for Integrated Circuit Failure Analysis", Invited Paper, Int Symp Physical and Failure Analysis of Integrated Circuits (IPFA 2009), 6-10 Jul 09, Suzhou, China, pg 11-18, 2009
  • Phang JCH, Chan DSH, Palaniappan M, Chin JM, Davis B, Bruce M, Wilcox J, Gilfeather G, Chua CM, Koh LS, Ng HY, Tan SH, “A Review of Laser Induced Techniques for Microelectronic Failure Analysis”, Invited Paper, Int Symp Physical and Failure Analysis of Integrated Circuits (IPFA 2004), 5-8 Jul 04, Hsinchu, Taiwan, pg 255-261, 2004
  • Phang JCH, Chan DSH, Ong VKS, Kolachina S, Chin JM, Palaniappan M, Gilfeather G, Seah YX, "Single Contact Beam Induced Current Phenomenon for Microelectronic Failure Analysis", Invited Paper, Microelectronics Reliability, Vol 43, pg 1595-1602, 2003
Updated: 23 Sep 2010