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Jiang Jing |
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Ph.D. candidate
Biomagnetics Laboratory (BML)
Phone:
(65) 6516-1496
Advisors:
Assist Prof. Bae, Seongtae
A Member
of
Biomagnetics Laboratory (BML)
Information Storage Materials Laboratory (ISML)
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I was born in Shandong, China in 1979 and obtained my Bachelor degree and Master degree in Materials Science and Engineering in the Hefei University of Technology, China in 2002 and 2005, respectively. I am currently under the NUS Graduate Scholarship.
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Thesis
Physical study of electromigration induced failure mechanisms of nano-structured current perpendicular to the plane
(CPP) magneto-resistive spin-valve read sensors
Research
Interests
Electromigration phenomenon in magnetic thin film materials
Current-perpendicular-to-plane GMR structure
Thin film deposition and nanofabrication techniques
Electrical and magnetic properties of the nano-structured materials
Publications
Jing Jiang, Ding Gui Zeng, Seongtae Bae, Hojun Ryu, and Kyung-Won Chung, “Effects of controlling Cu spacer inter-diffusion by diffusion barriers on the magnetic and electrical stability of GMR spin-valve devices, J. Magn. Magn. Mater., 322, 1834 (2010)
Jing Jiang, Seongtae Bae, and Hojun Ryu, " Magnetic instability of giant magnetoresistance spin valves due to electromigration induced inter-diffusion", Thin Solid Films, 517, 5557, (2009)
Jing Jiang and Seongtae Bae, Electromigration-induced failure characteristics of spin-valve multi-layers for metallic based spintronic devices , IEEE Trans. Device Mater. Rel., 8, 680 (2008)
Jing Jiang, Seongtae Bae, and Sun Wook Kim, "Effects of Cu interdiffusion on the electromigration failure of FM/Cu/FM tri-layers for spin valve read sensors" IEEE Trans. Magn. 43, 2836-2838, (2007)
Awards and Scholarships
NUS Graduate Research Scholarship
Work Experience
Conference
"Significant enhancement of electromigration-induced failure lifetime due to an ultra-thin Co insertion at the NiFe/Cu interface in GMR spin-valve read sensors", Jing Jiang, Seongtae Bae, and Ho Jun Ryu [DT-03], 53rd MMM Conference, Austin, Texas, USA (2008. 11. 10 ~ 14)
Jiang Jing, Kim Sun Wook, Bae Seongtae"Effect of Cu interdiffusion on the Electromigration failure of FM/Cu/FM trilayers for spin valve read sensors" 10th Joint MMM-Intermag Conference, Baltimore, Maryland, USA (2006. 01. 07 ~ 11)
Magnetic degradation of GMR spin-valve multi-layers due to electromigration induced failures", Jing Jiang, Seongtae Bae and Hojun Ryu [AS-03], Intermag Conference, Madrid, Spain, (2008. 05. 04 ~ 08)
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